In line with our "Winning by Sharing" philosophy PANalytical has made the XRDML data platform free and public. The XML schema is now available to you. You can download any version of the XML schema using the links below. However, we advise you to use always the latest version. The older versions are made available for legacy purposes.
You can also link to various websites containing XML background information or open the information document about the required version of the XML schema.
Ownership and copyright of the schema lies exclusively with PANalytical, as well as the right to make successor or derivate versions of the schema. In addition, PANalytical takes no responsibility for any disadvantages or damages caused by the use of this published schema.
Version 1.3
The differences between version 1.3 and 1.2 are:
- A new optional attribute "SampleMode" is added to the "Measurement" element. This attribute can have one of the following values: "Reflection", "Transmission" or "Capillary".
- The attribute "MeasurementType" of the "Measurement" element is extended with the value "Wobbled Scan". The wobbling axis is defined by the existing attribute "MeasurementStepAxis".
Version 1.2
In version 1.2 Focussing Mirrors are supported by extending the enumeration of the "shape" attribute with "Elliptic". This attribute is part of the "complexType" "crystalType".
Version 1.1
In version 1.1 the optional elements "name" and "preparedBy" have been added to "sampleType".
